
Yield losses from material failures can cost a fab line $1-10M per year. Most of that cost traces back to qualification decisions made with incomplete structure-property evidence.
In advanced packaging — the interconnects, substrates, and interface materials that sit between the die and the rest of the system — a material failure rarely shows up as a single dramatic event. It shows up as a yield curve that never quite reaches target, costing a fab line an estimated $1-10M per year once you add up the rework, scrap, and schedule slip.
The root cause is usually a qualification gap: the material was cleared against the properties the team knew to check, not against the full set of structure-property relationships that determine behavior under real thermal and mechanical cycling. As packaging moves toward SiC and GaN platforms, and as the NIST CHIPS Act framework pushes toward more rigorous structure-property qualification tooling, that gap gets more expensive to leave open.
Closing it isn't about running more tests — it's about knowing which tests matter for a given candidate material before you run them. That's a candidate-ranking and evidence problem: given a packaging constraint, which materials are worth qualifying at all, and what's the specific failure mode most likely to rule each one out first.